Quad-Fault Tolerant Architecture Design for Ripple Carry Adder

Authors

  • Vayalasetti Swarnalatha1, Praveen Kumar Polisetty 2 1 PG Scholar, Department of ECE, QIS College of Engineering and Technology, Ongole, India 2 Assistant Professor, Department of ECE, QIS College of Engineering and Technology, Ongole, India

Abstract

We consider quad fault cases and show how a system can reconfigure from an error causing four faults at maximum. A system must be fault tolerant to decrease the failure rate and increase the reliability of it. Multiple faults can affect a system simultaneously and there is a trade-off between area overhead and number of faults tolerated. Fault tolerant architecture design for a ripple carry adder assuming quad faults. Keywords: fault tolerant, Ripple carry adder, Test pattern generation.

Downloads

Published

2016-10-30

How to Cite

2, V. S. P. K. P. (2016). Quad-Fault Tolerant Architecture Design for Ripple Carry Adder. International Journal of Engineering Science and Generic Research, 2(5). Retrieved from https://ijesar.in/index.php/ijesar/article/view/57

Issue

Section

Articles