Symmetric transparent BIST for memory using March X algorithm
Symmetric Transparent BIST schemes for RAM modules assure the preservation of the memory contents during periodic testing while at the same time skipping the signature prediction phase required in transparent BIST schemes, achieving considerable reduction in test time. In this work the utilization of accumulator modules comprising adders implementing binary addition is proposed and BIST is implementing with Symmetric March X algorithm.
Keywords: online BIST, symmetric, SOC
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International Journal of Engineering Science and Generic Research (IJESAR) by Articles is licensed under a Creative Commons Attribution 4.0 International License.