ISSN: 2456-043X

International Journal of Engineering Science and Generic Research

An International Peer Review Journal for Engineering Science and Generic Research

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VHDL implementation of logic BIST (Built in self-test) Architecture for high test coverage in VLSI chips.

Bela Dubey

Volume : VOLUME 3 || Issue : ISSUE 3

Abstract :


Very Large Scale Integration (VLSI) has made a dramatic impact on the growth of integrated circuit technology. It has not only reduced the size and the cost but also increased the complexity of the circuits. The positive improvements have resulted in significant performance/cost advantages in VLSI systems. There are, however, potential problems which may retard the effective use and growth of future VLSI technology. Among these is the problem of circuit testing, which becomes increasingly difficult as the scale of integration grows. Because of the high device counts and limited input/output access that characterize VLSI circuits, conventional testing approaches are often ineffective and insufficient for VLSI circuits. The vital role of primitive polynomials for designing PN sequence generators. The standard LFSR (linear feedback shift register) used for pattern generation may give repetitive patterns. Which are in certain cases is not efficient for complete test coverage. The LFSR based on primitive polynomial generates maximum-length PRPG.Built-in self-test (BIST) is a commonly used design technique that allows a circuit to test itself. BIST has gained popularity as an effective solution over circuit test cost, test quality and test reuse problems. In this paper we are presenting an implementation of a tester using VHDL